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SiC IGBT degradation mechanism investigation under HV‑H3TRB tests
Ziming Wu Zongbei Dai Jian Zhou Huafeng Dong Wencan Wang
Feiwan Xie Haoran Wang Jiahui Yan Xiyu Chen Shaohua Yang
Fugen Wu
Vol. 24, No. 2, pp. 305-315, Feb. 2024
10.1007/s43236-023-00726-9
Feiwan Xie Haoran Wang Jiahui Yan Xiyu Chen Shaohua Yang
Fugen Wu
Vol. 24, No. 2, pp. 305-315, Feb. 2024
10.1007/s43236-023-00726-9
ISSN : 1598 - 2092
eISSN : 2093 - 4718